A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography

F Capotondi1, E Pedersoli, M Kiskinova

  • 1Fermi, Elettra Sincrotrone Trieste, SS 14 - km 163.5, 34149 Basovizza, Trieste, Italy. flavio.capotondi@elettra.trieste.it

Optics Express
|November 29, 2012
PubMed
Summary

Researchers used silicon nitride window corners in lensless X-ray microscopy as references for differential holography. This method, combined with iterative phasing, achieved high-resolution object reconstruction near 85 nm.

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