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Sideband spectroscopy and dispersion measurement in microcavities
Jiang Li1, Hansuek Lee, Ki Youl Yang
1T J Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, California 91125, USA.
Optics Express
|November 29, 2012
Summary
This study presents a sideband technique for precisely measuring microcavity dispersion, crucial for nonlinear devices. The method accurately quanties both geometrical and material dispersion contributions in high-Q microcavities.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Dispersion management is critical for nonlinear optical devices.
- Microcavities are key components in advanced photonic systems.
- Accurate dispersion measurement is essential for device design and optimization.
Purpose of the Study:
- To develop and validate a precise method for measuring microcavity dispersion.
- To differentiate between geometrical and material dispersion contributions.
- To enable spectral line mapping to transverse mode families.
Main Methods:
- Application of a sideband technique for dispersion measurement.
- Integration of the sideband technique with finite element simulations.
- Characterization of high-Q microcavities with microwave free spectral range.
Main Results:
- Accurate measurement of microcavity dispersion, including geometrical and material effects.
- Successful mapping of spectral lines to transverse mode families.
- Demonstrated relative precision of 5.5 × 10(-6) for a 2 mm disk cavity.
Conclusions:
- The sideband technique offers a precise and versatile tool for microcavity dispersion characterization.
- This method is applicable to high-Q microcavities relevant for nonlinear optics.
- The combined approach facilitates a deeper understanding of microcavity physics and device performance.
