Related Experiment Video
Updated: May 16, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Selective placement of faceted metal tips on semiconductor nanorods
Hendrik Schlicke1, Debraj Ghosh, Lam-Kiu Fong
1Department of Chemistry, University of California Berkeley, Berkeley, CA 94720, USA.
Angewandte Chemie (International Ed. in English)
|November 30, 2012
Abstract
No abstract available in PubMed .

