Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization
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1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. jliu@siom.ac.cn
Optics Letters
|December 4, 2012
Abstract:
We propose a technique for measuring infrared femtosecond pulses: transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 μm.
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