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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: May 15, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal.

Tadashi Matsushita1, Etsuo Arakawa, Wolfgang Voegeli

  • 1Photon Factory, Institute of Materials Structure Science, KEK, Tsukuba, Ibaraki, Japan. matsus@post.kek.jp

Journal of Synchrotron Radiation
|December 21, 2012
PubMed
Summary

A novel X-ray reflectometer measures reflectivity curves simultaneously without mechanical rotation. This advancement enables rapid, time-resolved X-ray studies of structural changes in materials.

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Related Experiment Videos

Last Updated: May 15, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
07:42

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature

Published on: March 11, 2022

High Pressure Single Crystal Diffraction at PX^2
11:32

High Pressure Single Crystal Diffraction at PX^2

Published on: January 16, 2017

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Analytical Chemistry

Background:

  • X-ray reflectometry is a powerful technique for characterizing thin films and surfaces.
  • Traditional X-ray reflectometers require mechanical rotation, limiting measurement speed and time-resolution.
  • Developing faster, more efficient reflectometry methods is crucial for studying dynamic processes.

Purpose of the Study:

  • To develop and demonstrate a novel X-ray reflectometer capable of simultaneous whole curve measurement.
  • To enable time-resolved X-ray studies of irreversible structural changes.
  • To showcase the instrument's versatility across different sample types.

Main Methods:

  • Utilized a bent-twisted crystal polychromator to generate a convergent X-ray beam with a continuously varying energy (E) and glancing angle (α).
  • Employed a horizontally placed sample at the focus to reflect the beam vertically.
  • Measured the reflected beam's intensity distribution using a two-dimensional pixel array detector (PILATUS 100K).

Main Results:

  • Successfully measured specular X-ray reflectivity curves from silicon wafers, gold films, and liquid ethylene glycol.
  • Achieved data collection times ranging from 0.01 to 1000 seconds.
  • Covered a momentum transfer range of 0.01-0.45 Å⁻¹ for silicon wafer samples.

Conclusions:

  • The developed X-ray reflectometer offers simultaneous measurement of reflectivity curves without mechanical rotation.
  • This technique significantly enhances the potential for time-resolved X-ray studies of dynamic structural changes.
  • The instrument demonstrates broad applicability for various materials and interfaces.