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Optical Trapping of Nanoparticles
Published on: January 15, 2013
Morphology-dependent trap formation in bulk heterojunction photodiodes
Guozheng Shao1, Glennis E Rayermann, Eric M Smith
1Department of Chemistry, University of Washington, Seattle, Washington 98195, USA.
The Journal of Physical Chemistry. B
|December 22, 2012
Summary
Local structural variations impact polymer solar cell aging. Photooxidation reveals faster degradation in F8BT-rich domains, affecting hole transport and overall device performance.
Area of Science:
- Materials Science
- Photovoltaics
- Polymer Chemistry
Background:
- Nanostructured polymer solar cells offer a promising renewable energy avenue.
- Understanding degradation mechanisms is crucial for improving device longevity.
- Local structural variations can significantly influence material properties and performance.
Purpose of the Study:
- To investigate the effect of local structural variation on the aging rate of nanostructured polymer solar cells.
- To compare time-resolved electrostatic force microscopy (trEFM) and conventional device measurements.
- To elucidate the degradation pathways in polymer blends under photooxidation.
Main Methods:
- Fabrication and characterization of photovoltaic devices using 1:1 blends of PFB and F8BT.
- In situ photooxidation of polymer films using 365, 405, and 455 nm illumination.
- Time-resolved electrostatic force microscopy (trEFM) and conventional device measurements to monitor changes.
Main Results:
- Faster loss of photocurrent generation observed in F8BT-rich domains during photooxidation.
- PFB-rich phases exhibited higher photoresponse even at wavelengths predominantly absorbed by F8BT.
- Evidence of more rapid degradation of PFB hole-transport pathways in F8BT-rich regions.
Conclusions:
- Local structural variations significantly affect the aging rate of polymer solar cells.
- Degradation kinetics are domain-dependent, influencing overall device performance.
- Loss of percolation pathways for hole transport in F8BT-rich phases contributes to device aging.

