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Updated: May 15, 2026

Non-equilibrium Microwave Plasma for Efficient High Temperature Chemistry
Published on: August 1, 2017
Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer
Petri Karvinen1, Simon Rutishauser, Aldo Mozzanica
1Paul Scherrer Institut, Villigen-PSI CH 5232, Switzerland. petri.karvinen@psi.ch
Abstract:
We present a spectrometer setup based on grating dispersion for hard x-ray free-electron lasers. This setup consists of a focusing spectrometer grating and a charge-integrating microstrip detector. Measurement results acquired at Linac Coherent Light Source are presented, demonstrating noninvasive monitoring of single-shot spectra with a resolution of 2.0×10(-4) ±0.3×10(-4) at photon energy of 6 keV with more than 95% transmission of the main beam.
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