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Updated: May 15, 2026

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

Light extraction by directional sources within optically dense media.

James R Nagel¹

¹Terahertz Device Corp., Salt Lake City, Utah 84124, USA. nageljr@ieee.org

|December 25, 2012

Summary

This summary is machine-generated.

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This study provides exact solutions for light extraction efficiency (LEE) from directional light-emitting devices, improving accuracy beyond isotropic models. The findings help validate simulations and quantify baseline LEE, considering Fresnel reflections at dielectric boundaries.

Area of Science:

Optoelectronics
Photonics
Semiconductor Devices

Background:

Light extraction efficiency (LEE) is typically measured against isotropic radiators in dielectric media.
This standard metric is often inaccurate for photonic devices with directional light sources.

Purpose of the Study:

To derive exact solutions for LEE from directive sources near planar dielectric boundaries.
To account for Fresnel reflections at the interface for accurate LEE calculations.
To provide a baseline for validating numerical simulations and source models.

Main Methods:

Analytical derivation of LEE for directive radiating sources.
Inclusion of Fresnel reflection effects at the dielectric interface.
Analysis of four source models: isotropic radiator, Hertzian dipoles (parallel/perpendicular), and Lambertian scatterer.

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Last Updated: May 15, 2026

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

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Main Results:

Exact LEE solutions were derived for directive sources, improving upon isotropic models.
Fresnel reflections were quantified, showing negligible impact with large escape cones.
LEE reduction of 20% or more was observed when the critical angle is below 25°.

Conclusions:

The derived exact solutions offer a more accurate method for LEE assessment in directional photonic devices.
These results are crucial for validating computational models and understanding baseline performance.
The study highlights the significant impact of Fresnel reflections on LEE in specific material systems.