Related Experiment Video
Updated: May 15, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Adaptive Perfectly Matched Layer for Wood's anomalies in diffraction gratings
Benjamin Vial1, Frédéric Zolla, André Nicolet
1Institut Fresnel, Domaine universitaire de Saint J´erˆome, 13397 Marseille cedex 20, France. benjamin.vial@fresnel.fr
Abstract:
We propose an Adaptive Perfectly Matched Layer (APML) to be used in diffraction grating modeling. With a properly tailored co-ordinate stretching depending both on the incident field and on grating parameters, the APML may efficiently absorb diffracted orders near grazing angles (the so-called Wood's anomalies). The new design is implemented in a finite element method (FEM) scheme and applied on a numerical example of a dielectric slit grating. Its performances are compared with classical PML with constant stretching coefficient.
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
UV–Vis Spectroscopy: Woodward–Fieser Rules

