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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 15, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

A scanning tunneling microscope capable of imaging specified micron-scale small samples.

Wei Tao1, Yufei Cao, Huafeng Wang

  • 1High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

The Review of Scientific Instruments
|January 3, 2013
PubMed
Summary

We developed a new scanning tunneling microscope (STM) for precise nanoscale imaging. This stable instrument achieves atomic resolution on small samples in ambient conditions.

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

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Serial Block-Face Scanning Electron Microscopy (SBF-SEM) of Biological Tissue Samples
09:21

Serial Block-Face Scanning Electron Microscopy (SBF-SEM) of Biological Tissue Samples

Published on: March 26, 2021

Area of Science:

  • Surface Science
  • Nanotechnology
  • Microscopy

Background:

  • Precise positioning of scanning tunneling microscope (STM) tips on small samples is challenging.
  • Existing STMs often require controlled environments and complex setups.

Purpose of the Study:

  • To present a novel home-built scanning tunneling microscope (STM) with enhanced positioning capabilities.
  • To demonstrate the instrument's ability to achieve high-resolution imaging of small, individual sample features.

Main Methods:

  • Utilized a stand-alone soft junction mechanical loop (SJML) for tip positioning.
  • Integrated a piezoelectric tube scanner and a U-like soft spring strip for precise tip alignment.
  • Employed an optical microscope for tip-sample alignment and a piezoelectric inertial motor for coarse approach.

Main Results:

  • Successfully achieved atomic resolution imaging and high-quality tunneling spectra of an individual graphite flake (32.5 × 32.5 μm²).
  • Demonstrated high repeatability and long-term stability of the STM structure over one month under ambient conditions.
  • Frequency analysis confirmed the absence of significant tip mount related resonant frequencies, indicating structural stability.

Conclusions:

  • The developed SJML-based STM offers precise positioning and stable operation for nanoscale imaging.
  • The instrument is suitable for high-resolution surface analysis of small, isolated features in ambient environments.
  • This novel STM design provides a stable and repeatable platform for surface science investigations.