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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Related Experiment Video

Updated: May 15, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Note: radiofrequency scanning probe microscopy using vertically oriented cantilevers.

G Valdrè1, D Moro

  • 1Department of Earth and Geo-Environmental Sciences, Alma Mater Studiorum - University of Bologna, Bologna 40126, Italy. giovanni.valdre@unibo.it

The Review of Scientific Instruments
|January 3, 2013
PubMed
Summary

This study introduces a modified atomic force microscope for simultaneous nanoscale topography and radio frequency (RF) spectra imaging. The technique enhances sensitivity to probe-sample distance and material properties.

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Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy
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Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy

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Last Updated: May 15, 2026

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Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy
12:58

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy

Published on: September 12, 2019

Area of Science:

  • Physics
  • Materials Science
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) is a key tool for nanoscale imaging.
  • Characterizing radio frequency (RF) properties at the nanoscale alongside topography is challenging.
  • Parasitic capacitance can limit the precision of AFM-based electrical measurements.

Purpose of the Study:

  • To develop a simple modification to standard AFM for simultaneous topography and RF spectra acquisition.
  • To minimize parasitic capacitance for improved measurement accuracy.
  • To investigate the sensitivity of RF impedance measurements to nanoscale interfaces.

Main Methods:

  • Modification of a standard Atomic Force Microscope.
  • Utilizing a microcantilever positioned perpendicular to the sample surface.
  • Connecting the cantilever to a Vector Network Analyzer (VNA) for RF impedance measurements (100 kHz - 8.5 GHz).

Main Results:

  • Simultaneous acquisition of nanoscale sample topography and RF spectra was achieved.
  • Parasitic capacitance was minimized through the described method.
  • The RF impedance signal demonstrated high sensitivity to probe-sample distances below 50 nm.
  • The RF signal was also sensitive to the material properties at the cantilever apex-sample interface.

Conclusions:

  • The modified AFM provides a powerful method for nanoscale characterization.
  • The technique allows for concurrent mapping of physical and RF properties.
  • This approach offers enhanced sensitivity for probing nanoscale interfaces and material characteristics.