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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
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Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M Lanza1, A Bayerl, T Gao

  • 1State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China.

Advanced Materials (Deerfield Beach, Fla.)
|January 3, 2013
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...