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Updated: May 15, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Multiple memory states in resistive switching devices through controlled size and orientation of the conductive
S Balatti1, S Larentis, D C Gilmer
1Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milano, MI, Italy.
Abstract:
Multilevel operation in resistive switching memory (RRAM) based on HfOx is demonstrated through variable sizes and orientations of the conductive filament. Memory states with the same resistance, but opposite orientation of defects, display a different response to an applied read voltage, therefore allowing an improvement of the information stored in each physical cell. The multilevel scheme allows a 50% increase (from 2 to 3 bits) of the stored information.
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