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Related Concept Videos

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Related Experiment Video

Updated: May 15, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Computerized interferometric surface measurements [Invited].

James C Wyant1

  • 1College of Optical Sciences, University of Arizona, 1630 E. University Boulevard, Tucson, Arizona 85721, USA. jcwyant@optics.arizona.edu

Applied Optics
|January 8, 2013
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Summary
This summary is machine-generated.

Computerized interferometry significantly enhances optical metrology. Advancements in surface shape and roughness measurement include computer-generated holograms, phase-shifting interferometry, interference microscopy, and dynamic interferometers.

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Area of Science:

  • Optical metrology
  • Surface metrology
  • Interferometry

Background:

  • Traditional interferometry faced limitations in precision and data analysis.
  • The integration of electronics and software has revolutionized optical measurement techniques.

Purpose of the Study:

  • To discuss advancements in computerized interferometry for optical metrology.
  • To highlight improvements in measuring surface shape and roughness.

Main Methods:

  • Computer-generated holograms for testing aspheric optics.
  • Phase-shifting interferometry for data acquisition and analysis.
  • Computerized interference microscopy (multiple-wavelength, coherence scanning) for microstructure analysis.
  • Vibration-insensitive dynamic interferometers for measurements in uncontrolled environments.

Main Results:

  • Significant improvements in the precision of optical metrology.
  • Enhanced capabilities for testing complex optical components like aspheric lenses.
  • Accurate measurement of surface microstructure and roughness.
  • Enabling precise measurements in challenging, non-ideal environments.

Conclusions:

  • Computerized interferometry offers substantial advancements in optical metrology.
  • These technologies enable higher precision and broader applicability in surface metrology.
  • Future developments will likely continue to push the boundaries of measurement accuracy and environmental adaptability.