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Related Experiment Video

Updated: May 15, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Atomic pair distribution functions analysis of disordered low-Z materials.

V Petkov¹, Y Ren, S Kabekkodu

¹Department of Physics, Central Michigan University, Mt. Pleasant, MI 48859, USA. petko1vg@cmich.edu

Physical Chemistry Chemical Physics : PCCP

|January 16, 2013

Summary

High-energy X-ray diffraction and pair distribution function analysis effectively characterize disordered low-Z materials. This technique accurately determines phase identity, mixture abundance, and atomic structure, boosting scientific confidence.

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Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Published on: June 7, 2018

Area of Science:

Materials Science
Solid-State Chemistry
Crystallography

Background:

Disordered low-Z materials are crucial in science and technology.
Characterizing these materials at an atomic level presents challenges.

Purpose of the Study:

To evaluate the efficacy of high-energy X-ray diffraction coupled with atomic pair distribution function analysis.
To demonstrate the technique's capability in analyzing diverse disordered low-Z materials.

Main Methods:

High-energy X-ray diffraction experiments.
Atomic pair distribution function (PDF) analysis.
Application to organic molecules, graphitic powders, polymers, and liquids.

Main Results:

Successful characterization of various disordered low-Z materials.
Accurate determination of phase identity and relative abundance in mixtures.
Detailed insights into atomic-scale structure were obtained.

Conclusions:

The technique is highly effective for disordered low-Z materials.
It provides reliable data on material composition and structure.
Increased confidence in applying this method is warranted for broader scientific use.