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Published on: May 10, 2021
Atomic pair distribution functions analysis of disordered low-Z materials
1Department of Physics, Central Michigan University, Mt. Pleasant, MI 48859, USA. petko1vg@cmich.edu
High-energy X-ray diffraction and pair distribution function analysis effectively characterize disordered low-Z materials. This technique accurately determines phase identity, mixture abundance, and atomic structure, boosting scientific confidence.
Area of Science:
- Materials Science
- Solid-State Chemistry
- Crystallography
Background:
- Disordered low-Z materials are crucial in science and technology.
- Characterizing these materials at an atomic level presents challenges.
Purpose of the Study:
- To evaluate the efficacy of high-energy X-ray diffraction coupled with atomic pair distribution function analysis.
- To demonstrate the technique's capability in analyzing diverse disordered low-Z materials.
Main Methods:
- High-energy X-ray diffraction experiments.
- Atomic pair distribution function (PDF) analysis.
- Application to organic molecules, graphitic powders, polymers, and liquids.
Main Results:
- Successful characterization of various disordered low-Z materials.
- Accurate determination of phase identity and relative abundance in mixtures.
- Detailed insights into atomic-scale structure were obtained.
Conclusions:
- The technique is highly effective for disordered low-Z materials.
- It provides reliable data on material composition and structure.
- Increased confidence in applying this method is warranted for broader scientific use.
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