Preparation of cross-sectional specimens of ceramic thermal barrier coatings for transmission electron microscopy

During the microstructural examination of ceramic thermal barrier coatings by transmission electron microscopy (TEM), initial efforts for the preparation of cross-sectional thin foils from interface regions by conventional means were mostly failures. Delamination of the Y2O3-stabilized ZrO2 ceramic coating from the nickel-base alloy substrate sometimes occurred during fine polishing at around 80 microns thickness but mostly occurred during dimpling. Because of this sensitivity, special techniques for mechanical handling were developed so that ion milling could give thin enough regions of the metal-ceramic interface. TEM showed convincingly that the highly fragile nature of the coatings is in fact due to the extensive porosity at the interface developed as a result of heat treatment.