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Updated: May 14, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Scattering by linear defects in graphene: a tight-binding approach

J N B Rodrigues1, N M R Peres, J M B Lopes dos Santos

  • 1CFP and Departamento de Física e Astronomia, Faculdade de Ciências Universidade do Porto, P-4169-007 Porto, Portugal.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|January 24, 2013
PubMed

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