Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
The de Broglie Wavelength
X-ray Crystallography
Debye–Huckel–Onsager Conductance Equation
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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
J N B Rodrigues1, N M R Peres, J M B Lopes dos Santos
1CFP and Departamento de Física e Astronomia, Faculdade de Ciências Universidade do Porto, P-4169-007 Porto, Portugal.
We developed a new method to calculate how light passes through defects in graphene using simple physics. This approach simplifies complex graphene defect analysis for researchers.
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