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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Frictional Force

Frictional Force

When a body is in motion, it encounters resistance because the body interacts with its surroundings. This resistance is known as friction, a common yet complex force whose behavior is still not completely understood. Friction opposes relative motion between systems in contact, but also allows us to move. Friction arises in part due to the roughness of surfaces in contact. For one object to move along a surface, it must rise to where the peaks of the surface can skip along the bottom of the...

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Updated: May 14, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Friction measurement on free standing plates using atomic force microscopy.

X S Tang¹, Y C Loke, P Lu

¹Institute of Materials Research and Engineering, Agency for Science Technology and Research, 3 Research Link, Singapore 117602.

The Review of Scientific Instruments

|February 8, 2013

Summary

This study presents a novel atomic force microscopy (AFM) method to measure friction on microfabricated silicon plates. The technique quantifies friction forces at the interface between the plate and substrate, enabling low-load measurements.

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Published on: February 27, 2015

Area of Science:

Materials Science
Nanotechnology
Tribology

Background:

Measuring friction on small, free-standing objects is challenging.
Existing methods may not be suitable for microscale or low-load applications.

Purpose of the Study:

To introduce a novel method for measuring friction on microfabricated silicon plates.
To enable precise friction force measurements at the microscale.

Main Methods:

Utilizes atomic force microscopy (AFM) with a microfabricated silicon plate resting on a substrate.
Measures friction by detecting cantilever twisting when the substrate is displaced laterally.
Ensures the AFM tip does not slide over the plate during measurement.

Main Results:

The method can measure friction forces in the nano-Newton to micro-Newton range.
Accurately quantifies the friction of the plate-substrate interface.
Demonstrates the capability to measure friction on macroscopic structures at low loads.

Conclusions:

The developed AFM-based method offers a sensitive and versatile approach for microscale friction analysis.
This technique expands the possibilities for studying friction in micro-electromechanical systems (MEMS) and other small-scale applications.
Provides a valuable tool for understanding tribological behavior at low applied loads.