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Updated: May 14, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
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Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

Published on: May 6, 2019

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Andras Kiss1, Julia H Jungmann, Donald F Smith

  • 1FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.

The Review of Scientific Instruments
|February 8, 2013
PubMed

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