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Updated: May 14, 2026
07:24
Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
Microscope mode secondary ion mass spectrometry imaging with a Timepix detector
Andras Kiss1, Julia H Jungmann, Donald F Smith
1FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.
The Review of Scientific Instruments
|February 8, 2013
Summary
This study introduces Timepix detector assemblies for secondary ion mass spectrometry (SIMS) imaging, achieving high-sensitivity, time-resolved ion detection for biomolecule analysis in tissue sections.
Area of Science:
- Materials Science
- Analytical Chemistry
- Biophysics
Background:
- In-vacuum active pixel detectors offer high sensitivity and parallel detection of ions.
- Secondary Ion Mass Spectrometry (SIMS) is a powerful surface analysis technique.
- Microscope mode SIMS enables high-resolution imaging of sample surfaces.
Purpose of the Study:
- To integrate a Timepix detector assembly with a secondary ion mass spectrometer for SIMS imaging.
- To evaluate the performance of this novel detector system for time- and space-resolved ion detection.
- To demonstrate the capability of the system for imaging biomolecules in tissue sections.
Main Methods:
- Combination of a Timepix detector assembly with a secondary ion mass spectrometer.
- Acquisition of time-resolved images from various benchmark samples.
- Microscope mode SIMS imaging of biomolecule distribution in tissue sections.
Main Results:
- Successful integration of Timepix detector with SIMS for microscope mode imaging.
- Demonstration of time-resolved imaging capabilities with high signal-to-noise ratio.
- Visualization of biomolecular distribution in tissue sections using the novel detector system.
Conclusions:
- The Timepix detector assembly is suitable for high-performance SIMS imaging.
- This approach enhances sensitivity and parallel acquisition of ion data.
- The system shows promise for advanced biomolecular imaging applications.
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