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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Related Experiment Video

Updated: May 14, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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An optically actuated surface scanning probe.

D B Phillips1, G M Gibson, R Bowman

  • 1H H Wills Physics Laboratories, University of Bristol, Bristol, England, UK. dave.phillips@bristol.ac.uk

Optics Express
|February 8, 2013
PubMed
Summary
This summary is machine-generated.

We developed a novel optically trapped probe for high-precision surface imaging, applying minimal forces. This technique allows for nanometre-level surface topography analysis, ideal for sensitive biological samples.

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The Microfluidic Probe: Operation and Use for Localized Surface Processing
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Published on: June 4, 2009

Area of Science:

  • Nanotechnology
  • Surface Science
  • Biophysics

Background:

  • Accurate surface topography imaging is crucial for understanding material properties and biological interactions.
  • Existing methods often apply excessive forces, limiting their use on delicate samples.

Purpose of the Study:

  • To develop and demonstrate a novel optically trapped probe for high-precision surface topography imaging.
  • To achieve nanometre precision while applying ultra-low, femto-Newton (fN) forces.

Main Methods:

  • Utilizing an extended, optically trapped probe with a specifically shaped design to control trap stiffness.
  • Implementing selective position clamping and force clamping to enhance sensitivity and refine surface contact response.
  • Scanning the probe over a calibration sample with graduated steps to assess performance.

Main Results:

  • Achieved a height resolution of approximately 11 nanometres (nm).
  • Estimated the applied force to the sample to be around 140 fN using equipartition theory.
  • Demonstrated the probe's capability for precise surface imaging with minimal force application.

Conclusions:

  • The developed optically trapped probe offers a highly sensitive and precise method for surface topography imaging.
  • The ultra-low force application makes this technique suitable for investigating delicate biological samples without causing damage.
  • This advancement opens new possibilities in nanoscale surface analysis and biological research.