Practical eight-frame algorithms for fringe projection profilometry

Related Experiment Video

Updated: May 14, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
11:34

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

Juan C Gutiérrez-García1, J F Mosiño, Amalia Martínez

  • 1Centro de Investigaciones en Óptica, Loma del Bosque 115, León, México.

Optics Express
|February 8, 2013
PubMed

More Related Videos

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform08:10

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform

Published on: October 6, 2019

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...