Experience with exchange and archiving of raw data: comparison of data from two diffractometers and four software

Simon W M Tanley1, Antoine M M Schreurs, John R Helliwell

  • 1School of Chemistry, Faculty of Engineering and Physical Sciences, University of Manchester, Brusnwick Street, Manchester M14 9PT, UK.

Journal of Applied Crystallography
|February 12, 2013
PubMed