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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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A comprehensive and comparative study of elastic electron scattering from OCS and CS2 in the energy region from 1.2

H Murai1, Y Ishijima, T Mitsumura

  • 1Department of Physics, Sophia University, Tokyo 102-8554, Japan.

The Journal of Chemical Physics
|February 15, 2013
PubMed

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