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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...

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Related Experiment Video

Updated: May 14, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

Spectrometer for hard X-ray free-electron laser based on diffraction focusing.

V G Kohn1, O Y Gorobtsov, I A Vartanyants

  • 1National Research Center `Kurchatov Institute', Kurchatov Square 1, Moscow, Russia.

Journal of Synchrotron Radiation
|February 16, 2013
PubMed
Summary

A novel diffraction focusing spectrometer (DFS) offers high-resolution X-ray energy spectrum measurement for X-ray free-electron laser (XFEL) pulses. This advancement enables detailed analysis of spectral structures with improved operational simplicity.

Keywords:
compound refractive lensesdiffraction focusing spectrometerhard X-ray free-electron laser

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
09:49

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

Published on: October 23, 2018

Related Experiment Videos

Last Updated: May 14, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
09:49

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

Published on: October 23, 2018

Area of Science:

  • Physics
  • Spectroscopy
  • Materials Science

Background:

  • X-ray free-electron lasers (XFELs) produce ultra-short, coherent X-ray pulses.
  • Existing X-ray spectrometers often lack the required energy resolution for detailed spectral analysis.

Purpose of the Study:

  • To propose and evaluate a novel Diffraction Focusing Spectrometer (DFS).
  • To achieve high-resolution energy spectrum measurement of single XFEL pulses.

Main Methods:

  • Utilizing dynamical scattering in a single-crystal plate for diffraction focusing.
  • Employing principles similar to metamaterial-based Pendry lenses.
  • Demonstrating operation across a wide energy range (5-20 keV).

Main Results:

  • Achieved an energy resolution of ΔE/E ≈ 2 × 10⁻⁶, significantly surpassing most current X-ray spectrometers.
  • Successfully measured the entire energy spectrum of single XFEL pulses.
  • Confirmed DFS operability from 5 keV to 20 keV.

Conclusions:

  • The proposed DFS provides unprecedented energy resolution for XFEL pulse analysis.
  • DFS offers a simpler and more effective alternative to existing spectrometers.
  • This technology can resolve fine spectral structures within XFEL pulses.