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Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
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Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects

Published on: January 4, 2016

Ab initio studies of fluorine passivation on the electronic structure of the NV- defect in nanodiamond

H Pinto1, D W Palmer, R Jones

  • 1College of Engineering, Mathematics and Physical Sciences, University of Exeter Stocker Road, Exeter EX4 4QL, United Kingdom.

Journal of Nanoscience and Nanotechnology
|February 21, 2013
PubMed

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