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Effect of concurrent joule heat and charge trapping on RESET for NbAlO fabricated by atomic layer deposition

Peng Zhou1, Li Ye, Qing Qing Sun

  • 1ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai, 200433, China. pengzhou@fudan.edu.cn.

Nanoscale Research Letters
|February 21, 2013
PubMed

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