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Formation of secondary Moiré patterns for characterization of nanoporous alumina structures in multiple domains with
Qinghua Wang1, Satoshi Kishimoto, Xiangfen Jiang
1Hybrid Materials Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
Nanoscale
|February 21, 2013
Abstract:
We first report the formation of secondary Moiré patterns from electron Moiré fringes to characterize nanostructures in multiple domains with different orientations. The pitches and the orientations of the nanoporous alumina arrays in several domains are simultaneously measured using only one electron Moiré image.
