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Updated: May 13, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Differentiation of deformation modes in nanocrystalline Pd films inferred from peak asymmetry evolution using in situ
Jochen Lohmiller1, Rudolf Baumbusch, Oliver Kraft
1Karlsruhe Institute of Technology, Institute for Applied Materials, P.O. Box 3640, 76021 Karlsruhe, Germany.
Abstract:
Synchrotron-based in situ tensile testing was used to study the dominant deformation mechanisms of nanocrystalline Pd thin films on a compliant substrate. An x-ray diffraction peak profile analysis reveals an (hkl) independent deformation induced peak asymmetry. It is argued that the asymmetry is caused by a broad distribution of elastic strains among individual grains and the complexity of accommodation processes. The reversal of peak asymmetry manifests the transition from heterogeneous microplasticity to dislocation-based macroplasticity. Independently, stress-driven grain boundary migration is active.
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