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Related Concept Videos

IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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UV–Vis Spectroscopy: Molecular Electronic Transitions01:16

UV–Vis Spectroscopy: Molecular Electronic Transitions

In Ultraviolet–Visible (UV–Vis) spectroscopy, the absorption of electromagnetic radiation is used to probe the electronic structure of molecules. This technique provides insights into molecular electronic transitions, particularly the movement of electrons between different molecular orbitals. Radiation is absorbed if the energy of the electromagnetic radiation passing through the molecule is precisely equal to the energy difference between the excited and ground states. During this process,...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...

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Proton Transfer and Protein Conformation Dynamics in Photosensitive Proteins by Time-resolved Step-scan Fourier-transform Infrared Spectroscopy
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Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability.

T N Stanislavchuk1, T D Kang, P D Rogers

  • 1Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102, USA. stantar@njit.edu

The Review of Scientific Instruments
|March 8, 2013
PubMed
Summary

A new far-infrared spectroscopic ellipsometer was developed for advanced materials analysis. This instrument enables precise characterization of magnetic and electric properties, distinguishing magnons and phonons in multiferroic materials.

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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Spectroscopy

Background:

  • Characterizing complex magnetic and electric properties of materials requires advanced spectroscopic techniques.
  • Distinguishing between magnetic and electric excitations like magnons and phonons is crucial for understanding multiferroic behavior.

Purpose of the Study:

  • To develop and demonstrate a far-infrared (far-IR) spectroscopic ellipsometer capable of full Mueller matrix measurements.
  • To enable the characterization of dielectric and magnetic properties, including magnetic permeability (μ ≠ 1), for bulk and thin-film anisotropic materials.
  • To showcase the capability of distinguishing magnetic and electric dipoles without prior modeling assumptions.

Main Methods:

  • Development of a far-IR spectroscopic ellipsometer at the U4IR beamline, utilizing synchrotron radiation and a Fourier-transform infrared (FT-IR) spectrometer.
  • Incorporation of rotating retarders and wire-grid linear polarizers for rotating analyzer and full-Mueller matrix (MM) spectral acquisition.
  • Utilizing a temperature-controlled sample stage (4.2–450 K) with extensive angular and translational control, coupled with LabVIEW-based automation software.
  • Data analysis based on Berreman's 4x4 propagation matrix formalism and nonlinear regression for extracting dielectric and magnetic permeability tensors.

Main Results:

  • Successful implementation of a versatile far-IR spectroscopic ellipsometer with broad spectral range (20–4000 cm⁻¹) and variable temperature control.
  • Demonstrated ability to acquire both rotating analyzer and full-Mueller matrix spectra.
  • Experimental validation on TbMnO3 and Dy3Fe5O12 single crystals, accurately determining dielectric and magnetic permeability tensors.
  • Experimental distinction between magnons and phonons from single MM measurements, and determination of magnetoelectric components in TbMnO3.

Conclusions:

  • The developed far-IR spectroscopic ellipsometer is a powerful tool for characterizing anisotropic materials with μ ≠ 1.
  • The technique allows for the direct distinction and characterization of magnetic and electric excitations in multiferroic and ferrimagnetic materials.
  • This advancement facilitates a deeper understanding of coupled magnetoelectric phenomena in advanced materials.