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Updated: May 13, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Published on: May 10, 2021

Structural mapping of disordered materials by nanobeam diffraction imaging and multivariate statistical analysis.

Ping Lu¹, Bryan D Gauntt

¹Sandia National Laboratories, Materials Characterization Department, P.O. Box 5800, Albuquerque, NM 87185-1411, USA. plu@sandia.gov

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|March 12, 2013

Summary

This summary is machine-generated.

This study introduces a hybrid nanobeam diffraction/imaging method for structural mapping of disordered materials. The technique reveals crystallographic details and short-range order without prior knowledge.

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Area of Science:

Materials Science
Nanotechnology
Crystallography

Background:

Disordered materials present challenges for structural characterization.
Existing methods may lack the resolution or specificity for complex systems.

Purpose of the Study:

To develop a novel hybrid method for detailed structural mapping of disordered materials.
To enable spatially resolved crystallographic information extraction.

Main Methods:

Combines diffraction imaging with nanobeam diffraction (NBD) pattern analysis.
Collects NBD patterns at predefined intervals for spatial mapping.
Utilizes multivariate statistical analysis and radial distribution function analysis.

Main Results:

Successfully maps structural components and their distribution in disordered materials.
Provides real-space maps of short-range order.
Demonstrated on systems with multiple amorphous and nanocrystalline phases.

Conclusions:

The hybrid nanobeam diffraction/imaging method is effective for characterizing complex disordered materials.
This technique offers a powerful tool for understanding materials with amorphous and nanocrystalline phases.