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Updated: May 13, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Direct quantification of ordering at a solid-liquid interface using aberration corrected transmission electron
Maria Gandman1, Yaron Kauffmann, Christoph T Koch
1Department of Materials Science and Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel.
Abstract:
We have used aberration corrected in situ transmission electron microscopy to study the interface between liquid Al and different sapphire facet planes, including quantitative analysis of the degree of residual contrast delocalization, ensuring that the experimental contrast perturbations can be associated with density perturbations in the liquid. The results confirm that the liquid is ordered at the interface, and the degree of ordering varies as a function of the sapphire facet planes, with a decreasing degree of order according to (0006) >(1210) >(1012) ≥ (1014).

