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Lossless Lines

Lossless Lines

In electrical engineering, a lossless transmission line is characterized by a purely imaginary propagation constant and a resistive characteristic impedance. The ABCD parameters, which describe the relationship between the input and output voltages and currents, indicate an equivalent π circuit with an imaginary series impedance and a shunt admittance. This results in a transmission line that, when the product of the phase constant (beta) and the length of the line is less than pi, exhibits...

Traveling Waves: Lossless Lines

Traveling Waves: Lossless Lines

The provided content explores the behavior of traveling waves on single-phase lossless transmission lines. It begins with a single-phase two-wire lossless transmission line of length Δx, characterized by a loop inductance LH/m and a line-to-line capacitance C F/m. These parameters result in a series inductance LΔx and a shunt capacitance CΔx.

Boundary Conditions: Lossless Lines

Boundary Conditions: Lossless Lines

Consider a single-phase, two-wire, lossless transmission line terminated by an impedance at the receiving end and a source with Thevenin voltage and impedance at the sending end. The line, with length, has a surge impedance and wave velocity determined by the line's inductance and capacitance.
At the receiving end, the boundary condition states that the voltage equals the product of the receiving-end impedance and current. This relationship is expressed as a function of the incident and...

Propagation of Waves

Propagation of Waves

When a wave propagates from one medium to another, part of it may get reflected in the first medium, and part of it may get transmitted to the second medium. In such a case, the interface of the two mediums can be considered as a boundary that is neither fixed nor free.
Consider a scenario where a wave propagates from a string of low linear mass density to a string of high linear mass density. In such a case, the reflected wave is out of phase with respect to the incident wave, however the...

Lossy Lines and Overvoltages

Lossy Lines and Overvoltages

Transmission-line series resistance and shunt conductance cause three primary effects: attenuation, distortion, and power losses.
Attenuation
When constant series resistance and shunt conductance are present, voltage and current equations are modified. The propagation constant indicates that voltage and current waves consist of both forward and backward traveling components. These waves attenuate as they propagate, with the attenuation factor related to the resistance and conductance. In a...

Bewley Lattice Diagram

Bewley Lattice Diagram

The Bewley lattice diagram, developed by L. V. Bewley, effectively organizes the reflections occurring during transmission-line transients. It visually represents how voltage waves propagate and reflect within a transmission line, making it easier to understand the complex interactions that occur.

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Related Experiment Video

Updated: May 13, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Published on: November 30, 2012

Method for characterization of Si waveguide propagation loss.

Michele Moresco¹, Marco Romagnoli, Stefano Boscolo

¹PhotonIC Corporation, 5800 Uplander Way, Los Angeles, CA 90230, USA.

|March 14, 2013

Summary

A novel method accurately measures waveguide propagation loss in silicon nanowires using mode interplay. This technique enables on-wafer testing of integrated photonic devices, improving characterization efficiency.

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Last Updated: May 13, 2026

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Area of Science:

Photonics and Nanotechnology
Materials Science

Background:

Accurate measurement of waveguide propagation loss is crucial for silicon photonics.
Existing methods may lack precision or on-wafer capabilities for nanoscale waveguides.

Purpose of the Study:

To present a new, accurate method for measuring waveguide propagation loss in silicon nanowires.
To enable on-wafer characterization of loss in test structures.

Main Methods:

Utilizes the interplay between traveling ring modes and standing wave modes.
Leverages back-scattering from edge roughness for measurement.
Applies to on-wafer measurement of test structures.

Main Results:

Demonstrates accurate loss measurements in silicon nanowires.
Provides examples of loss measurements and fitting.
Validates the method for practical on-wafer applications.

Conclusions:

The presented method offers an accurate and practical approach for characterizing waveguide propagation loss.
This technique is suitable for quality control and device optimization in silicon photonics fabrication.