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Related Experiment Video

Updated: May 13, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Published on: December 27, 2012

Broadband high-absorbance coating for terahertz radiometry.

Yuqiang Deng¹, Qing Sun, Jing Yu

¹Optics Division, National Institute of Metrology, Beijing 100013, China.

|March 14, 2013

Summary

We developed a simple, broadband, high-absorbance coating for terahertz radiometry. This coating enables traceable measurements of terahertz sources and detectors to SI units.

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Area of Science:

Physics
Materials Science
Metrology

Background:

Terahertz (THz) radiometry requires highly absorptive coatings for accurate measurements.
Existing absorbers may have limitations in spectral range or traceability.
Developing traceable standards for THz power is crucial for scientific advancement.

Purpose of the Study:

To develop and characterize a simple, broadband, high-absorbance coating for THz radiometry.
To evaluate the coating's performance in a THz radiometer and compare it with existing technologies.
To establish traceability of THz measurements to SI units using the developed coating.

Main Methods:

Characterization of spectral properties using a home-made terahertz time-domain spectrometer.
Fabrication of a THz radiometer utilizing the novel coating as the absorber.
Comparative analysis of heat transfer properties against a carbon nanotube array radiometer.

Main Results:

The coating exhibits spectral reflectance below 0.3% from 0.2 to 0.5 THz and below 0.1% from 0.5 to 2.0 THz.
The radiometer's responsivity is traceable to National Laser Power Standards due to high absorptivity in both THz and visible light.
The coating demonstrates ease of fabrication and effective heat transfer characteristics.

Conclusions:

A simple, broadband, high-absorbance coating for THz radiometry has been successfully developed.
The coating facilitates traceable measurements of THz sources and detectors to SI units.
This advancement offers a practical solution for metrology in the terahertz domain.