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Robustness of Lorenz-Mie microscopy against defects in illumination

Henrique W Moyses1, Bhaskar J Krishnatreya, David G Grier

  • 1Department of Physics and Center for Soft Matter Research, New York University, 4 Washington Place, New York 10003, New York, USA.

Optics Express
|March 14, 2013
PubMed

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