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Electron tomographic resolution of microns-thick specimens in the ultrahigh voltage electron microscope

Meng Cao1, Fang Wang, Zhi-Wei Qiao

  • 1Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.

Micron (Oxford, England : 1993)
|March 27, 2013
PubMed

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