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Updated: May 12, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Mohammad Ali Mohammad1, Steven K Dew, Maria Stepanova
1Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Alberta, T6G 2V4, Canada. M.A.Mohammad@ualberta.net.
This study details SML electron beam resist for high-aspect-ratio nanopatterning. The SML resist, when developed with IPA/water, shows high sensitivity and excellent pattern transfer, outperforming PMMA.
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