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A flange on electron spectromicroscope with spherical deflector analyzer--simultaneous imaging of reciprocal and real

Krzysztof P Grzelakowski1

  • 1OPTICON Nanotechnology, Muchoborska 18, PL54-424 Wroclaw, Poland. kgrzelakowski@op.pl

Ultramicroscopy
|April 3, 2013
PubMed

Keywords:
Chemical mappingEFPEEMElectron microscopeElectron spectromicroscopeEmission electron microscopyEnergy selective imagingImaging ESCAImaging energy analyzerImaging energy filterSPELEEMXPEEM

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