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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Tsung-Han Tsai1, David J Brady
1Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27705, USA.
This study introduces a novel single-shot polarization spectral imager. It efficiently captures spatial, spectral, and polarization data for advanced imaging applications.
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