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Automatic Laser-based Geometry Capture for Finite Element Analysis of Weld Beads
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Adaptive centroid-finding algorithm for freeform surface measurements.

Wenjiang Guo1, Liping Zhao, Chin Shi Tong

  • 1Optical Metrology Group, National Metrology Center, Singapore. wjguo.student@simtech.a-star.edu.sg

Applied Optics
|April 3, 2013
PubMed
Summary
This summary is machine-generated.

Accurate wavefront sensing relies on precise centroid finding for focal spot images. This study introduces an adaptive algorithm to improve accuracy, especially for degraded images common in freeform surface measurements.

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Area of Science:

  • Optical metrology
  • Surface characterization
  • Image processing

Background:

  • Wavefront sensing systems measure surface topography via centroid displacement of focal spots.
  • Accurate centroid localization is crucial for reliable measurement outcomes.
  • Image degradation in freeform surfaces complicates traditional thresholding-based centroid finding.

Purpose of the Study:

  • To investigate the impact of thresholding on centroid-finding accuracy in wavefront sensing.
  • To develop and validate an adaptive centroid-finding algorithm for improved measurement of freeform surfaces.
  • To address challenges posed by image degradation in focal spot analysis.

Main Methods:

  • Comparative analysis of widely used centroid-finding techniques.
  • Development of an adaptive thresholding algorithm for centroid localization.
  • Experimental validation of the proposed algorithm on freeform surfaces.

Main Results:

  • Thresholding is identified as the most critical factor influencing centroid-finding accuracy.
  • Standard thresholding methods are often inadequate for degraded freeform surface images.
  • The proposed adaptive algorithm demonstrates effectiveness in overcoming image degradation issues.

Conclusions:

  • Adaptive centroid finding significantly enhances measurement accuracy for freeform surfaces.
  • The developed algorithm offers a robust solution for challenging optical metrology applications.
  • This work contributes to more reliable and precise surface characterization techniques.