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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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π Electron Effects on Chemical Shift: Overview01:27

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Overview of Electron Microscopy01:25

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Updated: May 12, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Selective terminal function modification of SAMs driven by low-energy electrons (0-15 eV).

J Houplin1, L Amiaud, V Humblot

  • 1Université Paris-Sud, Institut des Sciences Moléculaires d'Orsay (ISMO), UMR 8214, Orsay, France.

Physical Chemistry Chemical Physics : PCCP
|April 6, 2013
PubMed
Summary
This summary is machine-generated.

Low-energy electrons selectively damage acid-terminated alkanethiol self-assembled monolayers (SAMs) at ~1 eV via resonant attachment, forming CO, CO2, and H2O. Higher energies damage both terminal groups and alkyl chains.

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Surface science
  • Materials science
  • Physical chemistry

Background:

  • Self-assembled monolayers (SAMs) are crucial in nanotechnology.
  • Understanding electron-induced degradation is vital for device stability.
  • Acid-terminated alkanethiols serve as model systems for SAM studies.

Purpose of the Study:

  • Investigate low-energy electron effects on 11-mercaptoundecanoic acid (MUA) SAMs.
  • Determine degradation mechanisms at varying electron energies (<11 eV).
  • Analyze damage to terminal functional groups and alkyl chains.

Main Methods:

  • Ultra-high vacuum (UHV) experiments at room and low temperatures (~40 K).
  • High Resolution Electron Energy Loss Spectroscopy (HREELS) for vibrational analysis.
  • Electron Stimulated Desorption (ESD) for neutral fragment detection.

Main Results:

  • Selective damage to terminal COOH groups at ~1 eV via resonant electron attachment.
  • Formation and desorption of CO, CO2, and H2O observed.
  • At higher energies, both terminal groups and alkyl chains undergo damage through resonant and non-resonant processes.

Conclusions:

  • Low-energy electrons induce distinct degradation pathways in MUA SAMs.
  • Electron energy dictates the selectivity of damage to SAM components.
  • Mechanisms involve resonant attachment and non-resonant processes affecting functional groups and chains.