Quantitative spin polarization analysis in photoelectron emission microscopy with an imaging spin filter

Area of Science:

• Surface Science
• Condensed Matter Physics
• Materials Science

Background:

• Ultrathin magnetic films are crucial for advanced electronic devices.
• Characterizing the spin polarization of these films is essential for understanding their magnetic properties.

Purpose of the Study:

• To demonstrate spin-resolved electron spectroscopic imaging of ultrathin magnetic cobalt films.
• To develop a quantitative method for measuring electron spin polarization simultaneously across multiple points.

Main Methods:

• Utilized a photoelectron emission microscope (PEEM) equipped with a spin-filter based on spin-dependent electron reflection.
• Integrated an aberration-corrected electrostatic energy analyzer with the PEEM column.
• Acquired two images at different electron scattering energies to derive spin polarization.

Main Results:

• Achieved spin-resolved electron spectroscopic imaging of Co films on Cu(100).
• Developed a method for quantitative measurement of electron spin polarization at 4 × 10³ points simultaneously.
• Successfully derived spin polarization without requiring magnetization reversal of the sample.

Conclusions:

• The developed PEEM-based method enables efficient and quantitative spin polarization analysis.
• This technique offers a valuable tool for studying magnetic materials.
• The ability to measure spin polarization without magnetization reversal simplifies experimental procedures.