Updated: May 12, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
1National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044 Japan. inoue.junichi@nims.go.jp
Researchers propose a simple optical method to distinguish topological insulators (TIs) from conventional ones. This technique uses electromagnetic interference waves to identify TIs, potentially accelerating TI research.
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