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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Imaging Biological Samples with Optical Microscopy01:18

Imaging Biological Samples with Optical Microscopy

Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
In optical microscopy, the specimen to be viewed is placed on a glass slide and clipped on the stage...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: May 12, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Ultrafast optical wide field microscopy.

M Seo1, S Boubanga-Tombet, J Yoo

  • 1Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.

Optics Express
|April 11, 2013
PubMed
Summary
This summary is machine-generated.

We developed ultrafast optical wide field microscopy for non-contact imaging. This method captures time-resolved carrier dynamics in semiconductors with high spatial and temporal resolution.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Semiconductor Physics

Background:

  • Understanding carrier dynamics is crucial for semiconductor device performance.
  • Existing imaging techniques often lack the necessary speed or resolution for ultrafast phenomena.

Purpose of the Study:

  • To introduce a novel imaging method, ultrafast optical wide field microscopy.
  • To demonstrate its capability in capturing ultrafast, time-resolved carrier dynamics.

Main Methods:

  • Development of ultrafast optical wide field microscopy.
  • Utilizing a smart pixel array detector for image acquisition.
  • Non-contact imaging of samples like semiconductor thin films and silicon nanowires.

Main Results:

  • Acquisition of wide field images with high spatial and temporal resolution.
  • Successful capture of time-resolved photoinduced transmission changes.
  • Demonstration of femtosecond time resolution and sub-micrometer spatial resolution in analyzing carrier dynamics.

Conclusions:

  • Ultrafast optical wide field microscopy offers a powerful tool for studying ultrafast carrier dynamics.
  • The method provides high sensitivity and resolution for diverse samples.
  • Enables detailed investigation of transient phenomena in materials.