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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Related Experiment Video

Updated: May 12, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

The backscatter electron signal as an additional tool for phase segmentation in electron backscatter diffraction.

E J Payton1, G Nolze

  • 1Federal Institute for Materials Research and Testing, 12205 Berlin, Germany. eric.payton@bam.de

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|April 12, 2013
PubMed
Summary
This summary is machine-generated.

Simultaneous electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) improve phase separation. Integrating backscatter electron (BSE) imaging aids in distinguishing similar cubic phases, enhancing multiphase material characterization.

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Last Updated: May 12, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

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Published on: April 1, 2017

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Analysis of SEC-SAXS data via EFA deconvolution and Scatter
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Analysis of SEC-SAXS data via EFA deconvolution and Scatter

Published on: January 28, 2021

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Geoscience

Background:

  • Simultaneous energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) mapping enhances phase separation capabilities.
  • Distinguishing similar cubic phases or small particles remains challenging due to larger EDS interaction volumes and noisy spectra.
  • Backscatter electron (BSE) signals are sensitive to local composition, offering potential for improved phase identification.

Purpose of the Study:

  • To investigate the utility of backscatter electron (BSE) imaging as a complementary technique to EDS for phase segmentation and identification.
  • To assess the effectiveness of combining EBSD, EDS, and BSE signals for multiphase material characterization.
  • To address limitations in distinguishing cubic phases with similar compositions or small particle sizes.

Main Methods:

  • Simultaneous data acquisition of EBSD patterns, EDS spectra, and BSE signals.
  • Analysis of specimens including meteorite, copper dross, and steel oxidation layers.
  • Utilizing the atomic number (Z) dependence of BSE signals for compositional sensitivity.

Main Results:

  • BSE imaging effectively assists in phase segmentation and identification when combined with EBSD and EDS.
  • The integrated approach demonstrated improved capabilities for characterizing multiphase materials.
  • Successful application across diverse sample types, including extraterrestrial and industrial materials.

Conclusions:

  • Simultaneous EBSD, EDS, and BSE signal acquisition offers significant potential for advanced multiphase material characterization.
  • BSE imaging provides crucial complementary compositional information, overcoming limitations of EDS alone.
  • This integrated approach enhances the resolution and accuracy of phase analysis in scanning electron microscopy.