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Soft X-ray spectromicroscopy using ptychography with randomly phased illumination.

A M Maiden¹, G R Morrison, B Kaulich

¹Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, UK.

Nature Communications

|April 12, 2013

Summary

This summary is machine-generated.

This study introduces a new ptychography method using a randomly phased X-ray probe to reduce diffraction data dynamic range. This technique enables robust imaging and chemical sensitivity in soft X-ray spectromicroscopy.

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Area of Science:

Diffractive imaging
X-ray microscopy
Spectromicroscopy

Background:

Ptychography retrieves sample transmission function and probe.
Large dynamic range of diffraction data is an experimental challenge.
Soft X-ray spectromicroscopy requires chemical sensitivity.

Purpose of the Study:

To develop a novel ptychographic experiment to reduce diffraction data dynamic range.
To demonstrate robust image reconstruction with weak scatter.
To showcase chemical sensitivity in soft X-ray spectromicroscopy.

Main Methods:

Utilized a randomly phased X-ray probe in a ptychographic setup.
Performed ptychographic reconstructions at X-ray energies around the iron L absorption edge.
Acquired and analyzed diffraction patterns with reduced dynamic range.

Main Results:

Successfully reduced the dynamic range of recorded diffraction patterns.
Achieved reliable and robust image reconstruction, even with weak specimen scatter.
Demonstrated chemical sensitivity without optical refocusing.
Phase and modulus signals were in perfect registration, providing complementary information.

Conclusions:

The novel ptychographic method effectively reduces diffraction data dynamic range.
This approach enhances robustness and enables chemical sensitivity in soft X-ray spectromicroscopy.
The phase signal offers complementary, sensitive information for analyzing local chemical environments.