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[Research on development and experiment of NIR wheat quality quick detection system].
Ling-Ling Liu1, Bo Zhao, Yin-Qiao Zhang
1National Key Laboratory of Soil-Plant-Machine System, Chinese Academy of Agricultural Mechanization Sciences, Beijing 100083, China. whyisp@sina.com
A new Near-Infrared (NIR) wheat quality detection system offers rapid, non-destructive analysis. This grating-based system demonstrates good prediction performance, stability, and repeatability for assessing wheat quality.
Area of Science:
- Agricultural Engineering
- Spectroscopy
- Data Analysis
Context:
- Rapid and non-destructive detection of wheat quality is crucial for the agricultural industry.
- Existing methods may be time-consuming or destructive, limiting real-time quality assessment.
- Near-Infrared (NIR) spectroscopy offers a promising alternative for rapid analysis.
Purpose:
- To develop and validate a novel Near-Infrared (NIR) wheat quality quick detection system based on grating technology.
- To evaluate the accuracy, repeatability, and stability of the developed system.
- To compare the performance of the developed system against a benchmark instrument (Bruker MPA spectroscopy).
Summary:
- A grating-based NIR system was developed for rapid, non-destructive wheat quality detection.
- Partial Least Squares (PLS) calibration models were built and validated using 56 wheat samples.
- The self-made system showed strong performance with high coefficients of determination (R2) and low errors (RMSECV, RMSEP), comparable to the Bruker MPA spectroscopy.
Impact:
- The developed NIR system provides a reliable and efficient tool for real-time wheat quality assessment.
- The findings support the use of grating-based NIR technology for agricultural product analysis.
- Improved wheat quality management can be achieved through rapid and accurate detection methods.
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