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Calibration of nonspherical particles in optical tweezers using only position measurement
Ann A M Bui1, Alexander B Stilgoe, Timo A Nieminen
1School of Mathematics and Physics, The University of Queensland, St. Lucia, Queensland 4072, Australia.
Optics Letters
|April 19, 2013
Abstract:
Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the position occupation probability. It is not necessary to assume the force is linear with displacement.
