You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 12, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Chih-Wen Yang1, Yi-Hsien Lu, Ing-Shouh Hwang
1Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, Republic of China.
Atomic force microscopy (AFM) reveals frequency-modulation mode offers accurate nanobubble height measurements on graphite surfaces. High peak forces in PeakForce mode do not remove nanobubble gas, supporting a gas aggregate model for nanobubble stability.
08:18Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry
Published on: March 4, 2021
08:31Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: